Journals Articles Conferences News About CLP
Submit a paper Email Alert
Search
Search
Articles
Journals
News
Advanced Search
Top Searches
2D MaterialsTransformation opticsQuantum PhotonicsSmall lasersSemiconductor UV PhotonicsSupersymmetric microring laser arrays

Acta Optica Sinica, Volume. 26, Issue 3, 379(2006)

Measurement of the Delay of the Quarter-Wave Plate by Phase-Modulated Ellipsometry

[in Chinese]1、*, [in Chinese]1, [in Chinese]1, [in Chinese]2, and [in Chinese]1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
    • show less
    AbstractGet PDF(in Chinese)
    Figures&Tables (0)
    Equations (0)
    References (1)
    Tools
    Paper Information
    Topics
    References(1)

    [2] [2] Yu-Lung Lo, Jing-Fung Lin, Sen-Yung Lee. Polariscope for simulataneous measurement of the principal axis and the phase retadation by use of two phase-locked extractions[J]. Appl. Opt., 2004, 43(34): 6248～6254

    CLP Journals

    [1] Song Helun, Li Huaqiang, Xian Hao, Yang Ruofu, Huang Jian, Jiang Wenhan. Application of Low-Coherence-Source Interferometric System to Phase Error Detection of Segmented Primary Mirrors for Large-Aperture Telescope[J]. Acta Optica Sinica, 2008, 28(8): 1523

    [2] Song Zhitang, Li Guohua, Peng Handong, Kong Fanmei, Kong Qingdian. Temperature Effect of Composite Compensator[J]. Acta Optica Sinica, 2009, 29(6): 1626

    [3] Song Lianke, Niu Mingsheng, Han Peigao, Hao Dianzhong, Ma Lili. Adjustability and Realization of Compensation Adjustment Type Laser Elliptic Polarizer[J]. Chinese Journal of Lasers, 2015, 42(1): 108004

    [4] Xu Canhua, Xu Qifeng, Xie Nan. Using Crystal Wedge to Measure Temperature Dependence of Quartz Wave Plates′ Phase Retardation[J]. Acta Optica Sinica, 2014, 34(2): 212004

    [5] TANG Yu-guo, HE Miao, CUI Ji-cheng, Bayanheshig, CHEN Shao-jie. Senamont based measuring method for birefringence of infrared crystal[J]. Optics and Precision Engineering, 2012, 20(10): 2176

    [6] [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], "A spectroscopic method for determining thickness of quartz wave plate," Chin. Opt. Lett. 4, 705 (2006)

    Tools

    Get Citation

    Copy Citation Text

    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Measurement of the Delay of the Quarter-Wave Plate by Phase-Modulated Ellipsometry[J]. Acta Optica Sinica, 2006, 26(3): 379

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Set citation alerts for article
    Save article for my favorites
    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Mar. 11, 2005

    Accepted: --

    Published Online: Apr. 20, 2006

    The Author Email: (zhaopei2004@sohu.com)

    DOI:

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology