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Acta Optica Sinica, Volume. 26, Issue 3, 379(2006)

Measurement of the Delay of the Quarter-Wave Plate by Phase-Modulated Ellipsometry

[in Chinese]1、*, [in Chinese]1, [in Chinese]1, [in Chinese]2, and [in Chinese]1
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  • 2[in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Measurement of the Delay of the Quarter-Wave Plate by Phase-Modulated Ellipsometry[J]. Acta Optica Sinica, 2006, 26(3): 379

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Mar. 11, 2005

    Accepted: --

    Published Online: Apr. 20, 2006

    The Author Email: (zhaopei2004@sohu.com)

    DOI:

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology