Imaging method of single layer graphene on metal substrate based on imaging ellipsometer with large field of view

Guiyun Li; Liyuan Gu; Jingpei Hu; Linglin Zhu; Aijun Zeng; Huijie Huang

doi:10.3788/COL201917.011201

Chinese Optics Letters, Volume. 17, Issue 1, 011201(2019)

Imaging method of single layer graphene on metal substrate based on imaging ellipsometer with large field of view

Guiyun Li^1,2, Liyuan Gu^1,2, Jingpei Hu¹, Linglin Zhu¹, Aijun Zeng^1,2、*, and Huijie Huang^1,2

¹Laboratory of Information Optics and Opto-Electronic Technology, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China

²University of Chinese Academy of Sciences, Beijing 100049, China

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Cited By

[1] Ruxue Wei, Liwen Jiang, Xuqing Sun, Hongyao Liu, Xue Wang, Chang Wang, Xinchao Lu, Chengjun Huang. Detecting the morphology of single graphene sheets by dual channel sampling plasmonic imaging. Optics Express, 28, 4686(2020).

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Guiyun Li, Liyuan Gu, Jingpei Hu, Linglin Zhu, Aijun Zeng, Huijie Huang, "Imaging method of single layer graphene on metal substrate based on imaging ellipsometer with large field of view," Chin. Opt. Lett. 17, 011201 (2019)

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Paper Information

Category: Instrumentation, measurement, and metrology

Received: Aug. 8, 2018

Accepted: Nov. 12, 2018

Posted: Nov. 14, 2018

Published Online: Jan. 17, 2019

The Author Email: Aijun Zeng (aijunzeng@siom.ac.cn)

DOI:10.3788/COL201917.011201

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology