Fig. 1. Schematic diagram of the imaging ellipsometer setup.

Fig. 2. Experimental images of two different places on the graphene sample surface captured by a conventional light microscope.

Fig. 3. Experimental images of two different places on the graphene sample surface captured by a polarized light microscope.

Fig. 4. Experimental images of two different places on the graphene sample under the brightfield imaging mode with the reflected light from the graphene surface extinguished and captured by the large field-of-view imaging ellipsometer.

Fig. 5. Experimental images of the same place on the graphene sample under the large field-of-view imaging ellipsometer captured under (a) brightfield and (b) darkfield imaging modes with the reflected light from surfaces of (a) graphene and (b) Au film substrate extinguished, respectively.