Fig. 1. Classification of optical aspheric surface testing technology

Fig. 2. High-accuracy devices using a mechanical probes^[63-64]

Fig. 3. Schematic diagrams of the Hartman & Shack-Hartman tests

Fig. 4. Schematic diagrams of structured light methods

Fig. 5. Research and application of the PMD method^[21,71]

Fig. 6. Schematic diagram of the Ronchi test

Fig. 7. Schematic diagram of the Foucault knife-edge test

Fig. 8. Schematic diagrams of testing paraboloids using aberration-free point method

Fig. 9. Schematic diagrams of null test by the refractive compensator

Fig. 10. Schematic diagrams of CGH with a carrier

Fig. 11. Principle diagram of CGH

Fig. 12. Null test using CGH (by Wyant J C)

Fig. 13. Optical layout model of the CGH test plate

Fig. 14. Optical layout model of the CGH zone plate

Fig. 15. Null tests of optical aspheric surface using DM^[35.38,96]

Fig. 16. Null test of the aspheric surface using SLM^[43]

Fig. 17. Basic flows of the IRO algorithm

Fig. 18. Optical layout of the non-null test using singlet PNC^[46]

Fig. 19. Optical layout of the non-null test using aspheric PNC^[106]

Fig. 20. Optical layout of the non-null test using reflective PNC^[107]

Fig. 21. Schematic diagram of the ASSI method

Fig. 22. ZYGO Verifire interferometer by using the annular sub-aperture division mode like in the ASSI method^[111]

Fig. 23. Schematic diagram of the CSSI method

Fig. 24. QED interferometer based on CSSI and VON^[41]

Fig. 25. An example of the overlapping-area-stitching algorithm

Fig. 26. Schematic diagram of the TWI method^[54]

Fig. 27. Pictures of the Lupho Scan profiler^[63]

Fig. 28. Pictures of SOC-CMM^[117-118]

Fig. 29. Classification of shearing interferometry

Fig. 30. Aspheric surface testing based on QWLSI^[122]

Fig. 31. Principle model of annular RSI

Fig. 32. Dimetior AS interferometer based on the SNI method

Fig. 33. Optical layout of the metrology systems using PNC

Fig. 34. Schematic diagram of PNC adjustment

Fig. 35. Optical layout of the aspheric test based on CGH