Chinese Optics Letters, Volume. 14, Issue 5, 051602(2016)
Investigation of low-temperature cathodoluminescence mechanism of Er-doped GaN thick films by ion implantation
Fig. 1. Normalized room temperature cathodoluminescence spectra of virgin GaN and
Fig. 2. Normalized room temperature cathodoluminescence spectra of
Fig. 3. Normalized room temperature cathodoluminescence spectra of
Fig. 4. Room temperature cathodoluminescence spectra of Er-implanted GaN with different doses annealed at 1100°C. The accelerating voltage of the scanning electron microscope is 5 kV.
Fig. 5. Cathodoluminescence spectra of
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Xiaodan Wang, Yajuan Mo, Xionghui Zeng, Hongmin Mao, Jianfeng Wang, Ke Xu, "Investigation of low-temperature cathodoluminescence mechanism of Er-doped GaN thick films by ion implantation," Chin. Opt. Lett. 14, 051602 (2016)
Category: Materials
Received: Jan. 9, 2016
Accepted: Mar. 4, 2016
Published Online: Aug. 6, 2018
The Author Email: Xiaodan Wang (xdwang0416@163.com), Xionghui Zeng (xhzeng2007@sinano.ac.cn)