Journals Articles Conferences News About CLP
Submit a paper Email Alert
Search
Search
Articles
Journals
News
Advanced Search
Top Searches
2D MaterialsTransformation opticsQuantum PhotonicsSmall lasersSemiconductor UV PhotonicsSupersymmetric microring laser arrays

Acta Optica Sinica, Volume. 42, Issue 18, 1812004(2022)

Design, Calibration, and Measurement of Single Wavelength Mid-Infrared Mueller Matrix Ellipsometer

Zhou Zheng1,2 and Junfeng Hou1,2、*
Author Affiliations
  • 1National Astronomical Observatories of Chinese Academy of Sciences, Beijing 100101, China
  • 2School of Astronomy and Space Science, University of Chinese Academy of Sciences, Beijing 100049, China
    • show less
    AbstractGet PDF(in Chinese)
    Figures&Tables (9)
    Equations (0)
    References (17)
    Cited By (4)
    Tools
    Paper Information
    Topics
    Cited By

    Article index updated: Mar. 10, 2025

    The article is cited by 4 article(s) CLP online library. (Some content might be in Chinese.)
    Tools

    Get Citation

    Copy Citation Text

    Zhou Zheng, Junfeng Hou. Design, Calibration, and Measurement of Single Wavelength Mid-Infrared Mueller Matrix Ellipsometer[J]. Acta Optica Sinica, 2022, 42(18): 1812004

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Set citation alerts for article
    Save article for my favorites
    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Jan. 13, 2022

    Accepted: Mar. 25, 2022

    Published Online: Sep. 15, 2022

    The Author Email: Hou Junfeng (jfhou@bao.ac.cn)

    DOI:10.3788/AOS202242.1812004

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology