Chinese Journal of Lasers, Volume. 35, Issue s1, 81(2008)
Concept Design of Three-Line Capillary: Possible Source for Extreme Ultraviolet Lithography
[2] [2] Vivek Bakshi, Rainer Lebert, Bernhard Jagle et al.. Status report on EUV source development and EVU source applications in EVUL[C].SPIE, 2007, 6533(15): 1~11
[3] [3] Takaharu Mitura, Katsuhiko Murakami, Kazuaki Suzuki et al.. Nikon EUVL development progress update[C]. SPIE, 2007, 6517(7): 1~10
[4] [4] J. J. Rocca. Table-top soft X-ray lasers[J]. Review of Scientific Instruments, 1999, 70(10): 3799~3827
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Zhang Xingqiang, Cheng Yuanli, Wang Qi. Concept Design of Three-Line Capillary: Possible Source for Extreme Ultraviolet Lithography[J]. Chinese Journal of Lasers, 2008, 35(s1): 81