Acta Optica Sinica, Volume. 35, Issue 7, 705001(2015)

An Accurate Method for Measuring Interference Fringe Period in Scanning Beam Interference Lithography System

[in Chinese]1,2、*, [in Chinese]1, [in Chinese]1, [in Chinese]1, and [in Chinese]1,2
Author Affiliations
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  • 2[in Chinese]
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    References(13)

    [1] [1] Paul Thomas Konkola. Design and Analysis of a Scanning Beam Interference Lithography System for Patterning Gratings with Nanometer-Level Distortions[D]. Boston: Massachusetts Institute of Technology, 2003.

    [2] [2] Carl G Chen. Beam Alignment and Image Metrology for Scanning Beam Interference Lithography-Fabricating Gratings with Nanometer Phase Accuracy[D]. Boston: Massachusetts Institute of Technology, 2003.

    [3] [3] Juan Montoya. Toward Nano-accuracy in Scanning Beam Interference Lithography[D]. Boston: Massachusetts Institute of Technology, 2006.

    [4] [4] Yong Zhao. Ultra-High Precision Scanning Beam Interference Lithography and its Application -Spatial Frequency Multiplication [D]. Boston: Massachusetts Institute of Technology, 2008.

    [5] [5] Bin Yu, Wei Jia, Changhe Zhou, et al.. Grating imaging scanning lithography[J]. Chin Opt Lett, 2013, 11(8): 080501.

    [6] [6] Li Fengyou. Study on Technology of Laser Direct Writing Photolithogrophy[D]. Changchun:Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, 2002.

    [7] [7] J C Montoya, C H Chang, R K Heilmann, et al.. Doppler writing and linewidth control for scanning beam interference lithography[J]. J Vac Sci Technol B, 23(6): 2640-2645.

    [9] [9] Ralf K Heilmann, Paul T Konkola, Carl G Chen,et al.. Digital heterodyne interference fringe control system [J]. J Vac Sci Technol B, 19(6): 2342-2346.

    [10] [10] Jiang Shan, Bayanheshig, Song Ying, et al.. Effect of measured interference fringe period error on groove profile of grating masks in scanning beam interference lithography system [J]. Acta Optica Sinica, 2014, 34(4): 0405003.

    [11] [11] Jiang Shan, Bayanheshig, Li Wenhao, et al.. Effect of period setting value on printed phase in scanning beam interference lithography system[J]. Acta Optica Sinica, 2014, 34(9): 0905003.

    [12] [12] Zhou Bingkun, Gao Yizhi, Chen Tirong, et al.. Priciples of Laser[M]. Beijing: National Defense Industry Press, 2009.

    [13] [13] Carl G Chen, Ralf K Heilmann, Paul T Konkola, et al.. A novel sub-microradian beam diagnostic and alignment system[C]. Proceedings of ASPE 16th annual meeting, 2001, 25: 216-219.

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    [1] Lu Yuxian, Qi Xiangdong, Yu Haili, Li Xiaotian, Zhang Shanwen, Jiang Shan, Yin Lu. Precision Analysis of Grating Replicated Mosaic Error Based on the Principle of Fraunhofer[J]. Chinese Journal of Lasers, 2016, 43(5): 508005

    [2] Lu Yuxian, Qi Xiangdong, Mi Xiaotao, Jiang Shan, Yu Haili, Li Xiaotian, Yin Lu. Detection and Calculation of Mosaic Grating Error Based on Wavefront Method[J]. Acta Optica Sinica, 2016, 36(5): 505001

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. An Accurate Method for Measuring Interference Fringe Period in Scanning Beam Interference Lithography System[J]. Acta Optica Sinica, 2015, 35(7): 705001

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    Paper Information

    Category: Diffraction and Gratings

    Received: Nov. 20, 2014

    Accepted: --

    Published Online: May. 20, 2015

    The Author Email: (jiangshan0122@126.com)

    DOI:10.3788/aos201535.0705001

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