Journal of Infrared and Millimeter Waves, Volume. 40, Issue 2, 184(2021)
Three-dimensional structure analysis of Schottky barrier diode in CMOS technology for terahertz imaging
[13] Chang W L, Meng C, Huang G W. SBD layout optimization with effect of N-well to p-substrate pn junctions in 0.18 μm CMOS process[C](2016).
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Da-Sheng CUI, Jia-Ming YANG, Hong-Xuan YAO, Xin LYU. Three-dimensional structure analysis of Schottky barrier diode in CMOS technology for terahertz imaging[J]. Journal of Infrared and Millimeter Waves, 2021, 40(2): 184
Category: Research Articles
Received: Jun. 29, 2020
Accepted: --
Published Online: Aug. 31, 2021
The Author Email: Da-Sheng CUI (dscui@bit.edu.cn)