[1] [1] F. Goos, H. Hnchen. Ein neuer und fundamentaler Versuch zur Totalreflexion [J]. Ann. Physik, 1947, 1(7～8):333～346

[2] [2] K. Artmann. Berechnung der Seitenversetzung des totalreflektieren Strahles [J]. Ann. Phys. , 1948, 2(1～2):87～102

[3] [3] R. H. Renard. Total reflection: a new evaluation of the Goos-Hnchen shift [J]. J. Opt. Soc. Am., 1964, 54(10):1190～1197

[4] [4] H. Kogelnik, H. P. Weber. Stored energy, power flow in dielectric waveguides [J]. J. Opt. Soc. Am., 1974, 64(2):174～185

[5] [5] C. K. Carniglia, K. R. Brownstein. Focal shift and ray model for total internal reflection [J]. J. Opt. Soc. Am., 1977, 67(1):121～122

[6] [6] J. P. Hugonin, R. Petit. tude générale des éplacements a la réflexion totale [J]. J. Optics (Paris), 1977, 8(2):73～87

[7] [7] N. J. Harrick. Study of physics and chemistry of surface from frustrated total internal reflections [J]. Phys. Rev. Lett., 1960, 4(5):224～226

[8] [8] H. K. V. Lotsch. Beam displacement at total reflection: the Goos-Hnchen effect. Ⅲ [J]. Optik, 1971, 32(4):299～319

[9] [9] A. M. Steinberg, R. Y. Chiao. Dispersionless, highly superluminal propagation in a medium with a gain doublet [J]. Phys. Rev. A, 1994, 49(3):2071～2075

[10] [10] Ph. Balcou, L. Dutriaux. Dual optical tunneling times in frustrated total internal reflection [J]. Phys. Rev. Lett., 1997, 78(5):851～854

[11] [11] Chunfang Li. Comment on photonic tunneling time in frustrated total internal reflection [J]. Phys. Rev. A, 2002, 65:066101-1～066101-3

[12] [12] Takaharu Hashimoto, Toshihiko Yoshino. Optical heterodyne sensor using the Goos-Hnchen shift [J]. Opt. Lett., 1989, 14(17):913～915

[13] [13] T. Sakata, H. Togo, F. Shimokawa. Reflection-type 2×2 optical waveguide switch using the Goos-Hnchen shift effect [J]. Appl. Phys. Lett., 2000, 76(20):2841～2843

[14] [14] N. Bloembergen, C. H. Lee. Total reflection in second-harmonic generation [J]. Phys. Rev. Lett., 1967, 19(15):835～837

[15] [15] O. Emile, T. Galstyan, A. Le Floch et al.. Measurement of the nonlinear Goos-Hnchen effect for Gaussian optical beams [J]. Phys. Rev. Lett., 1995, 75(8):1511～1513

[16] [16] Bradley M. Jost, Abdul-Azeez R. Al-Rashed, Bahaa E. A. Saleh. Observation of the Goos-Hnchen effect in a phase-conjugate mirror [J]. Phys. Rev. Lett., 1998, 81(11):2233～2235

[17] [17] M. Greena, P. Kirkbya, R. S. Timsita. Experimental results on the longitudinal displacement of light beams near total reflection [J]. Phys. Lett. A, 1973, 45(3):259～260

[18] [18] J. J. Cowan, B. Anicin. Longitudinal and transverse displacements of a bounded microwave beam at total internal reflection [J]. J. Opt. Soc. Am., 1977, 67(10):1307～1314

[19] [19] A. Haibel, G. Nimtz, A. A. Stahlhofen. Frustrated total reflection:The double-prism revisited [J]. Phys. Rev. E, 2001, 63(4):047601-1～047601-3

[20] [20] Hervé Gilles, Sylvain Girard, Joseph Hamel. Simple technique for measuring the Goos-Hnchen effect with polarization modulation and a position-sensitive detector [J]. Opt. Lett., 2002, 27(16):1421～1423

[21] [21] X. Yin, L. Hesselink, Z. Liu et al.. Large positive and negative lateral optical beam displacements due to surface plasmon resonance [J]. Appl. Phys. Lett., 2004, 85(3):372～374

[22] [22] R. Kaiser, Y. Levy, J. Fleming et al.. Resonances in a single thin dielectric layer:enhancement of the Goos-Hnchen shift [J]. Pure Appl. Opt., 1996, 5(6):891～898

[23] [23] Li Chunfang, Yang Xiaoyan. Thin-film enhanced Goos-Hnchen shift in total internal eflection [J]. Chin. Phys. Lett., 2004, 21(3):485～488

[24] [24] F. Pillon, H. Gilles, S. Girard et al.. Goos-Hnchen and Imbert-Fedorov shifts for leakly guided modes [J]. J. Opt. Soc. Am. B, 2005, 22(6):1290～1299