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Chinese Journal of Lasers, Volume. 33, Issue 6, 753(2006)

Microwave Measurement of Dielectric Film-Enhanced Goos-Hanchen Shift

[in Chinese]1,2、*, [in Chinese]3, [in Chinese]1, and [in Chinese]1
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Microwave Measurement of Dielectric Film-Enhanced Goos-Hanchen Shift[J]. Chinese Journal of Lasers, 2006, 33(6): 753

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    Paper Information

    Category: Laser physics

    Received: Oct. 23, 2005

    Accepted: --

    Published Online: Jun. 13, 2006

    The Author Email: (chunfang@opt.ac.cn)

    DOI:

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology