[1] XIAO SH L, LI B CH. Residual stress measurement methods of optics[J]. Opto-Electronic Engineering, 47, 190068(2020).

[2] PEIXOTO C, VALENTIM P T, SOUSA P C et al. Injection molding of high-precision optical lenses: A review[J]. Precision Engineering, 76, 29-51(2022).

[3] MA X H, MAO J, LONG L X. Measurement of residual stress in the micro-zone of the sample by X ray diffractometer[J]. Laboratory Science, 25, 10-13,18(2022).

[4] XU G, XING L CH, ZHANG T. Measurement of residual stress in superalloy bellow using X-ray diffraction technology[J]. Pressure Vessel Technology, 38, 32-37(2021).

[5] BAO Y W, MA D L. Evaluation of residual stress in ceramic coatings and its size effects[J]. Journal of the Chinese Ceramic Society, 47, 1033-1038(2019).

[6] LIU M ZH, LIANG K, XIONG W. Effect of deposition parameters on residual stress and microstructure in magnetron sputtering Au thin films[J]. Navigation and Control, 19, 98-104,73(2020).

[7] ZHENG J H, LI ZH X, LIU Q Y. Effect of negative bias voltage on preparation of diamond-like carbon films with high interfacial strength[J]. Journal of Materials Engineering, 51, 93-100(2023).

[8] KAJIHARA Y, TAKAHASHI R, YOSHIDA I et al. Measurement method of internal residual stress in plastic parts using terahertz spectroscopy[J]. Nanomanufacturing and Metrology, 4, 46-52(2021).

[9] FARAHANI B V, DIREITO F, SOUSA P J et al. Electronic Speckle Pattern Interferometry for fatigue crack monitoring[J]. Procedia Structural Integrity, 37, 873-879(2022).

[10] YADAV N, WACHTARCZYK K, GĄSIOR P et al. In-line residual strain monitoring for thermoplastic automated tape layup using fiber Bragg grating sensors[J]. Polymer Composites, 43, 1590-1602(2022).

[11] LI K W, WANG SH, LIU Z L. Stress birefringence measurement based on double cascaded photoelastic modulation with differential frequencies[J]. Acta Optica Sinica, 43, 0412001(2023).

[12] ZHANG W, YANG L, LIU C. A stress birefringence measurement method based on photoelastic modulator[J]. Optics & Optoelectronic Technology, 19, 64-69(2021).

[13] WANG CH Y, LIU W, NIU Y et al. Using the reflection ellipsometry to detect the stress for the gold coating reflection mirrors[J]. Microgravity Science and Technology, 34, 98(2022).

[14] [14] AZZAM R M A, BASHARA N M, BALLARD S S. Ellipsometry polarized light[J]. Physics Today, 1978, 31(11): 72.

[15] ARWIN H, WELIN-KLINTSTRÖM S, JANSSON R. Off-null ellipsometry revisited: basic considerations for measuring surface concentrations at solid/liquid interfaces[J]. Journal of Colloid and Interface Science, 156, 377-382(1993).

[16] JIN X N, WANG CH Y, SHEN J et al. Linear off null working condition for total internal reflection imaging ellipsometry to detect subtle electron density change[J]. Proceedings of SPIE, 11781, 117811I(2020).