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Laser & Optoelectronics Progress, Volume. 59, Issue 13, 1322004(2022)

Study on Continuation Correction of Ion Beam Polishing to Remove Border Effect

Di Zhou, Shilei Jiang*, Guobin Sun, Le Kang, and Weiguo Liu
Author Affiliations
  • School of Optoelectronic Engineering, Xi’an Technological University, Xi’an 710021, Shaanxi , China
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    Article index updated: Sep. 7, 2025

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    Di Zhou, Shilei Jiang, Guobin Sun, Le Kang, Weiguo Liu. Study on Continuation Correction of Ion Beam Polishing to Remove Border Effect[J]. Laser & Optoelectronics Progress, 2022, 59(13): 1322004

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    Paper Information

    Category: Optical Design and Fabrication

    Received: Aug. 30, 2021

    Accepted: Oct. 27, 2021

    Published Online: Jun. 9, 2022

    The Author Email: Shilei Jiang (jiangshilei8@163.com)

    DOI:10.3788/LOP202259.1322004

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology