Laser & Optoelectronics Progress, Volume. 62, Issue 2, 0212004(2025)
Lightweight GCP-YOLOv8s for Insulator Defect Detection
Fig. 7. Feature fusion structure after adding small defect detection layer. (a) Default path of YOLOv8s; (b) after adjusting
Fig. 9. Aerial images of partial insulators. (a) Display of defects; (b) examples of data enhancement; (c) fogging effect under different fog thickness (L: brightness, D: fog thickness)
Fig. 10. Information visualization of insulator defect dataset. (a) Category and quantity; (b) distribution of central points; (c) defect size distribution
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Fuzhen Huang, Tianci Wang. Lightweight GCP-YOLOv8s for Insulator Defect Detection[J]. Laser & Optoelectronics Progress, 2025, 62(2): 0212004
Category: Instrumentation, Measurement and Metrology
Received: Apr. 22, 2024
Accepted: Jun. 3, 2024
Published Online: Dec. 17, 2024
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CSTR:32186.14.LOP241147