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Laser & Optoelectronics Progress, Volume. 62, Issue 2, 0212004(2025)

Lightweight GCP-YOLOv8s for Insulator Defect Detection

Fuzhen Huang* and Tianci Wang
Author Affiliations
  • College of Automation Engineering, Shanghai University of Electric Power, Shanghai 200090, China
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    Article index updated: Sep. 12, 2025

    The article is cited by 2 article(s) CLP online library. (Some content might be in Chinese.)
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    Fuzhen Huang, Tianci Wang. Lightweight GCP-YOLOv8s for Insulator Defect Detection[J]. Laser & Optoelectronics Progress, 2025, 62(2): 0212004

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Apr. 22, 2024

    Accepted: Jun. 3, 2024

    Published Online: Dec. 17, 2024

    The Author Email:

    DOI:10.3788/LOP241147

    CSTR:32186.14.LOP241147

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology