Laser & Optoelectronics Progress, Volume. 57, Issue 5, 051201(2020)
Profile Measurement of High-Reflective Surface Based on Projected Fringe Profilometry and Independent Component Analysis
Fig. 8. Polarization images at different rotation angles. (a) Polarization image at 20°; (b) polarization image at 40°; (c) polarization image at 60°
Fig. 9. Separation images using ICA. (a) Specular components; (b) diffuse components
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Yixiang Zhang, Lianxin Zhang. Profile Measurement of High-Reflective Surface Based on Projected Fringe Profilometry and Independent Component Analysis[J]. Laser & Optoelectronics Progress, 2020, 57(5): 051201
Category: Instrumentation, Measurement and Metrology
Received: Jul. 29, 2019
Accepted: Aug. 27, 2019
Published Online: Mar. 5, 2020
The Author Email: Lianxin Zhang (lianxinzhang@caep.cn)