Laser & Optoelectronics Progress, Volume. 57, Issue 5, 051201(2020)

Profile Measurement of High-Reflective Surface Based on Projected Fringe Profilometry and Independent Component Analysis

Yixiang Zhang and Lianxin Zhang*
Author Affiliations
  • Institute of Machinery Manufacturing Technology, China Academy of Engineering Physics, Mianyang, Sichuan 621900, China
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    Figures & Tables(12)
    Experimental setup
    Reflection model of object surface
    Relationship between intensity and rotation angle of polarizer
    Main procedure of ICA
    Newton iteration algorithm
    Flow chart of experiment
    Distortion fringe image
    Polarization images at different rotation angles. (a) Polarization image at 20°; (b) polarization image at 40°; (c) polarization image at 60°
    Separation images using ICA. (a) Specular components; (b) diffuse components
    Reconstructed result of traditional projected fringe profilometry
    Reconstructed result of ICA algorithm
    • Table 1. Fitting results of valid data obtained by two methodsmm

      View table

      Table 1. Fitting results of valid data obtained by two methodsmm

      ConditionTraditionalmethodICA
      Radius sizeActual length
      Larger radius126.18126.59126.39
      Smaller radius123.94124.32124.12
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    Yixiang Zhang, Lianxin Zhang. Profile Measurement of High-Reflective Surface Based on Projected Fringe Profilometry and Independent Component Analysis[J]. Laser & Optoelectronics Progress, 2020, 57(5): 051201

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Jul. 29, 2019

    Accepted: Aug. 27, 2019

    Published Online: Mar. 5, 2020

    The Author Email: Lianxin Zhang (lianxinzhang@caep.cn)

    DOI:10.3788/LOP57.051201

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