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Laser & Optoelectronics Progress, Volume. 57, Issue 5, 051201(2020)

Profile Measurement of High-Reflective Surface Based on Projected Fringe Profilometry and Independent Component Analysis

Yixiang Zhang and Lianxin Zhang*
Author Affiliations
  • Institute of Machinery Manufacturing Technology, China Academy of Engineering Physics, Mianyang, Sichuan 621900, China
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    Article index updated: Sep. 12, 2025

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    Yixiang Zhang, Lianxin Zhang. Profile Measurement of High-Reflective Surface Based on Projected Fringe Profilometry and Independent Component Analysis[J]. Laser & Optoelectronics Progress, 2020, 57(5): 051201

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Jul. 29, 2019

    Accepted: Aug. 27, 2019

    Published Online: Mar. 5, 2020

    The Author Email: Lianxin Zhang (lianxinzhang@caep.cn)

    DOI:10.3788/LOP57.051201

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology