Detection of Static Aberrations in Imaging Optical Path Considering Residual Constraints of Wavefront Sensor

Cibao Zhang; Libo Zhong; Changhui Rao

doi:10.3788/LOP232155

Laser & Optoelectronics Progress, Volume. 61, Issue 14, 1412002(2024)

Detection of Static Aberrations in Imaging Optical Path Considering Residual Constraints of Wavefront Sensor

Cibao Zhang^1,2,3,4,5, Libo Zhong^1,2,3,4、*, and Changhui Rao^1,2,3,4、**

Author Affiliations

¹Key Laboratory on Adaptive Optics, Chinese Academy of Sciences, Chengdu 610209, Sichuan, China

²Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu 610209, Sichuan, China

³University of Chinese Academy of Sciences, Beijing 100049, China

⁴School of Electronic, Electrical and Communication Engineering, University of Chinese Academy of Sciences, Beijing 100049, China

⁵National Key Laboratory of Optical Field Manipulation Science and Technology, Chengdu 610209, Sichuan, China

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Cibao Zhang, Libo Zhong, Changhui Rao. Detection of Static Aberrations in Imaging Optical Path Considering Residual Constraints of Wavefront Sensor[J]. Laser & Optoelectronics Progress, 2024, 61(14): 1412002

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Paper Information

Category: Instrumentation, Measurement and Metrology

Received: Sep. 19, 2023

Accepted: Nov. 27, 2023

Published Online: Jul. 4, 2024

The Author Email: Libo Zhong (chrao@ioe.ac.cn), Changhui Rao (zhonglibo@ioe.ac.cn)

DOI:10.3788/LOP232155

CSTR:32186.14.LOP232155

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology