Spatial–spectral sparse deep learning combined with a freeform lens enables extreme depth-of-field hyperspectral imaging

Yitong Pan; Zhenqi Niu; Songlin Wan; Xiaolin Li; Zhen Cao; Yuying Lu; Jianda Shao; Chaoyang Wei

doi:10.1364/PRJ.541560

Photonics Research, Volume. 13, Issue 4, 827(2025)

Spatial–spectral sparse deep learning combined with a freeform lens enables extreme depth-of-field hyperspectral imaging

Yitong Pan^1,2,3,4, Zhenqi Niu^1,2,3,4,5, Songlin Wan^1,2,3,4, Xiaolin Li^1,2,3,4, Zhen Cao^1,2,3,4, Yuying Lu^1,2,3,4, Jianda Shao^1,2,3,4, and Chaoyang Wei^1,2,3,4、*

Author Affiliations

¹Precision Optical Manufacturing and Testing Center, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China

²Key Laboratory for High Power Laser Material of Chinese Academy of Sciences, Shanghai Institute of Optics and Fine Mechanics, Shanghai 201800, China

³Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China

⁴China-Russia Belt and Road Joint Laboratory on Laser Science, Shanghai 201800, China

⁵e-mail: niuzhenqi@siom.ac.cn

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Supplementary Materials

Visualization 1 | To assess the imaging speed of our system, we record the motion of falling blocks using proposed system. We push down the blocks from about 0.3 m height by a pen and capture the falling process with a speed of camera about 33 ms/frame. As can be seen

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Yitong Pan, Zhenqi Niu, Songlin Wan, Xiaolin Li, Zhen Cao, Yuying Lu, Jianda Shao, Chaoyang Wei, "Spatial–spectral sparse deep learning combined with a freeform lens enables extreme depth-of-field hyperspectral imaging," Photonics Res. 13, 827 (2025)

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Paper Information

Category: Imaging Systems, Microscopy, and Displays

Received: Sep. 6, 2024

Accepted: Jan. 3, 2025

Published Online: Mar. 10, 2025

The Author Email: Chaoyang Wei (siomwei@siom.ac.cn)

DOI:10.1364/PRJ.541560

CSTR:32188.14.PRJ.541560

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology