Journal of Infrared and Millimeter Waves, Volume. 42, Issue 5, 634(2023)

Study of Zinc-diffused InGaAs/InP planar infrared detector processed with rapid thermal annealing

Jia-Sheng CAO1,2,3, Tao LI1,2、*, Yi-Zhen YU1,2, Chun-Lei YU1,2, Bo YANG1,2, Ying-Jie MA1,2, Xiu-Mei SHAO1,2, Xue LI1,2, and Hai-Mei GONG1,2、**
Author Affiliations
  • 1State Key Laboratories of Transducer Technology,Shanghai Institute of Technical Physics,Chinese Academy of Sciences,Shanghai 200083,China
  • 2Key Laboratory of Infrared Imaging Materials and Detectors,Chinese Academy of Sciences,Shanghai 200083,China
  • 3Graduate School of the Chinese Academy of Sciences,Beijing 100039,China
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    References(25)

    [11] Yin Hao, Li Yong-Fu, Wang Wen-Juan et al. Scanning capacitance microscopy characterization on diffused p-n junctions of InGaAs/InP infrared detectors[J]. Proc SPIE, 7658, 237-238(2010).

    [15] Cao Gao-Qi. Study on high sensitivity planar InGaAs short wavelength infrared detector[D](2016).

    [19] Gurp G V, Boudewijn P R, Kempeners M et al. Zinc diffusion in n‐type indium phosphide[J]. Journal of Applied Physics, 61, 1846-1855(1987).

    [22] Liu E K, Zhu B S, Luo J S et al[M]. The Physics of Semiconductors(2003).

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    Jia-Sheng CAO, Tao LI, Yi-Zhen YU, Chun-Lei YU, Bo YANG, Ying-Jie MA, Xiu-Mei SHAO, Xue LI, Hai-Mei GONG. Study of Zinc-diffused InGaAs/InP planar infrared detector processed with rapid thermal annealing[J]. Journal of Infrared and Millimeter Waves, 2023, 42(5): 634

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    Paper Information

    Category: Research Articles

    Received: Dec. 15, 2022

    Accepted: --

    Published Online: Aug. 30, 2023

    The Author Email: Tao LI (litao@mail.sitp.ac.cn), Hai-Mei GONG (hmgong@mail.sitp.ac.cn)

    DOI:10.11972/j.issn.1001-9014.2023.05.008

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