Acta Optica Sinica, Volume. 45, Issue 15, 1512002(2025)

Accuracy of Dispersion Measurement Using Frequency-Domain White Light Interferometry

Yisu Wang1, Dongyu Yan2、*, Bowen Liu1、*, Youjian Song1, and Minglie Hu1
Author Affiliations
  • 1Ultrafast Laser Laboratory, School of Precision Instrument and Optoelectronics Engineering, Tianjin University, Tianjin 300072, China
  • 2School of Electronic Engineering, Tianjin University of Technology and Education, Tianjin 300222, China
  • show less
    References(26)

    [7] Li H, Chen J B, Ye X Y et al. Femtosecond-written 10-kW chirped and tilted fiber Bragg gratings[J]. Chinese Journal of Lasers, 51, 0215001(2024).

    [8] Tian X, Tian W L, Li Q et al. High power Kerr-Lens mode-locked femtosecond laser with broadband highly reflective mirrors compensating dispersion[J]. Chinese Journal of Lasers, 50, 0701001(2023).

    [10] Dong H Y, Zhao Z C, Sun N N et al. Dispersion analysis of second harmonic generation in lithium niobate thin film waveguide[J]. Journal of Infrared and Millimeter Waves, 42, 300-305(2023).

    [12] Lin Z H, Wang L H, Zhu S D et al. Polarization mode dispersion measurement for a meter-level slot waveguide[J]. Optical Communication Technology, 47, 66-71(2023).

    [15] Fu Y Y, Liu J H, Wang W G et al. Comparison of typical window function characteristics in interferometric imaging spectroscopy restoration[J]. Acta Optica Sinica, 44, 1130001(2024).

    [19] Yan G W. The research of spectral interferometric precise topography measurement method applied to microstructures[D](2022).

    [21] Yao J F, Zhang Y M, Gao Y et al. Fabrication of chirped fiber grating with small dispersion and its dispersion measurement method[J]. Chinese Journal of Lasers, 51, 2206007(2024).

    Tools

    Get Citation

    Copy Citation Text

    Yisu Wang, Dongyu Yan, Bowen Liu, Youjian Song, Minglie Hu. Accuracy of Dispersion Measurement Using Frequency-Domain White Light Interferometry[J]. Acta Optica Sinica, 2025, 45(15): 1512002

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Mar. 19, 2025

    Accepted: May. 8, 2025

    Published Online: Aug. 13, 2025

    The Author Email: Dongyu Yan (bwliu@tju.edu.cn), Bowen Liu (bwliu@tju.edu.cn)

    DOI:10.3788/AOS250771

    CSTR:32393.14.AOS250771

    Topics