Acta Optica Sinica, Volume. 45, Issue 15, 1512002(2025)
Accuracy of Dispersion Measurement Using Frequency-Domain White Light Interferometry
Fig. 1. Dispersion measurement system based on Michelson interferometer. (a) Schematic diagram of measurement system; (b) light source spectrum
Fig. 2. Data processing of Gaussian spectrum. (a) Simulated interferogram with its upper and lower envelopes; (b) normalized interference spectrum and unwrapped phase; (c) reference and calculated GDD values
Fig. 3. Variation of RMSE with time delay and bandwidth factor. (a) Gaussian spectrum; (b) ASE source spectrum
Fig. 4. Data processing of ASE spectrum. (a) Simulated interferogram with its upper and lower envelopes; (b) normalized interference spectrum and unwrapped phase; (c) reference and calculated GDD values
Fig. 5. RMSE varies with delay and bandwidth factor. (a) SF66 sample; (b) F2 sample
Fig. 6. Fourier transform images of interference spectra and Fourier transform images after removing background light. (a)(c) Fourier transform images of interference spectra; (b)(d) Fourier transform images after removing background light
Fig. 7. Measurement results of SF66 and F2 samples. (a)(c) Interference spectra with upper and lower envelopes; (b)(d) measured and reference GDD values
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Yisu Wang, Dongyu Yan, Bowen Liu, Youjian Song, Minglie Hu. Accuracy of Dispersion Measurement Using Frequency-Domain White Light Interferometry[J]. Acta Optica Sinica, 2025, 45(15): 1512002
Category: Instrumentation, Measurement and Metrology
Received: Mar. 19, 2025
Accepted: May. 8, 2025
Published Online: Aug. 13, 2025
The Author Email: Dongyu Yan (bwliu@tju.edu.cn), Bowen Liu (bwliu@tju.edu.cn)
CSTR:32393.14.AOS250771