Acta Optica Sinica, Volume. 45, Issue 15, 1512002(2025)

Accuracy of Dispersion Measurement Using Frequency-Domain White Light Interferometry

Yisu Wang1, Dongyu Yan2、*, Bowen Liu1、*, Youjian Song1, and Minglie Hu1
Author Affiliations
  • 1Ultrafast Laser Laboratory, School of Precision Instrument and Optoelectronics Engineering, Tianjin University, Tianjin 300072, China
  • 2School of Electronic Engineering, Tianjin University of Technology and Education, Tianjin 300222, China
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    Figures & Tables(7)
    Dispersion measurement system based on Michelson interferometer. (a) Schematic diagram of measurement system; (b) light source spectrum
    Data processing of Gaussian spectrum. (a) Simulated interferogram with its upper and lower envelopes; (b) normalized interference spectrum and unwrapped phase; (c) reference and calculated GDD values
    Variation of RMSE with time delay and bandwidth factor. (a) Gaussian spectrum; (b) ASE source spectrum
    Data processing of ASE spectrum. (a) Simulated interferogram with its upper and lower envelopes; (b) normalized interference spectrum and unwrapped phase; (c) reference and calculated GDD values
    RMSE varies with delay and bandwidth factor. (a) SF66 sample; (b) F2 sample
    Fourier transform images of interference spectra and Fourier transform images after removing background light. (a)(c) Fourier transform images of interference spectra; (b)(d) Fourier transform images after removing background light
    Measurement results of SF66 and F2 samples. (a)(c) Interference spectra with upper and lower envelopes; (b)(d) measured and reference GDD values
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    Yisu Wang, Dongyu Yan, Bowen Liu, Youjian Song, Minglie Hu. Accuracy of Dispersion Measurement Using Frequency-Domain White Light Interferometry[J]. Acta Optica Sinica, 2025, 45(15): 1512002

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Mar. 19, 2025

    Accepted: May. 8, 2025

    Published Online: Aug. 13, 2025

    The Author Email: Dongyu Yan (bwliu@tju.edu.cn), Bowen Liu (bwliu@tju.edu.cn)

    DOI:10.3788/AOS250771

    CSTR:32393.14.AOS250771

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