Acta Optica Sinica, Volume. 44, Issue 16, 1615001(2024)

Surface Defect Detection of Mobile Phone Covers Based on Improved BiSeNet V2

Bo Liu, Tingting Wang*, and Jie Liu
Author Affiliations
  • College of Mechanical and Electrical Engineering, Hohai University, Changzhou 213200, Jiangsu , China
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    References(18)

    [1] Wang N, Liu L T, Song X J et al. Subsurface defect detection method of optical elements based on through-focus scanning optical microscopy[J]. Acta Optica Sinica, 43, 2112001(2023).

    [2] Li Z H, Fang F Z, Ren Z H et al. Polished surface defect detection based on intelligent surface analysis[J]. Laser & Optoelectronics Progress, 60, 2412006(2023).

    [7] Xu Z F, Liu Y F, Xu W. Research on defect detection method for mobile phone white glass based on machine vision[J]. China New Telecommunications, 21, 120-121(2019).

    [10] Wu C, Yu D Y. Research on classified detection of surface defects of mobile phone glass cover based on deep convolutional neural network[J]. Software Engineering, 24, 6-10(2021).

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    Bo Liu, Tingting Wang, Jie Liu. Surface Defect Detection of Mobile Phone Covers Based on Improved BiSeNet V2[J]. Acta Optica Sinica, 2024, 44(16): 1615001

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    Paper Information

    Category: Machine Vision

    Received: Feb. 27, 2024

    Accepted: Apr. 18, 2024

    Published Online: Aug. 2, 2024

    The Author Email: Tingting Wang (20121894@hhu.edu.cn)

    DOI:10.3788/AOS240659

    CSTR:32393.14.AOS240659

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