Chinese Journal of Lasers, Volume. 45, Issue 1, 103002(2018)

Development of a Novel Optical Variable Attenuator in Lithography Exposure System

Li Meixuan1,2、*, Wang Li1, and Dong Lianhe1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    Figures & Tables(8)
    Schematic of lithography exposure system
    Structure diagram of the new optical variable attenuator. (a) Two-dimensional structure; (b) three-dimensional structure
    Relationship between transmittance of attenuation films and incident angle
    Relationship between reflectance of antireflective films and incident angle
    Relationship between wavelength and reflectance of antireflective films
    Test schematic of optical variable attenuator transmittance
    Transmittance of attenuator at different incident angles
    • Table 1. Characteristic of common coating materials for 193 nm wavelength

      View table

      Table 1. Characteristic of common coating materials for 193 nm wavelength

      Optional materialRefractive indexTransparent area /μmMelting point /℃Evaporation temperature /℃
      MgF21.40-1.450.11-1012661540
      AlF31.40-1.450.2-20890900
      SiO21.45-1.550.2-917001600
      LaF31.60-1.650.2-1214901490
      CaF21.65-1.750.3-514601350
      Al2O31.70-1.800.2-820202100
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    Li Meixuan, Wang Li, Dong Lianhe. Development of a Novel Optical Variable Attenuator in Lithography Exposure System[J]. Chinese Journal of Lasers, 2018, 45(1): 103002

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    Paper Information

    Category: materials and thin films

    Received: Jul. 18, 2017

    Accepted: --

    Published Online: Jan. 24, 2018

    The Author Email: Meixuan Li (limeixuannuc@163.com)

    DOI:10.3788/CJL201845.0103002

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