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Chinese Optics Letters, Volume. 22, Issue 3, 031701(2024)

Stimulated emission–depletion-based point-scanning structured illumination microscopy

Lei Wang1,2, Meiting Wang1, Luwei Wang3, Xiaomin Zheng3, Jiajie Chen3、*, Wenshuai Wu3, Wei Yan3, Bin Yu3, Junle Qu3, Bruce Zhi Gao4, and Yonghong Shao3、**
Author Affiliations
  • 1Guangdong Key Laboratory for Biomedical Measurements and Ultrasound Imaging, National-Regional Key Technology Engineering Laboratory for Medical Ultrasound, School of Biomedical Engineering, Shenzhen University Medical School, Shenzhen 518060, China
  • 2Key Laboratory of Opto-electronic Information Science and Technology of Jiangxi Province, Nanchang Hangkong University, Nanchang 330063, China
  • 3College of Physics and Optoelectronics Engineering, Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, Shenzhen University, Shenzhen 518060, China
  • 4Department of Bioengineering and COMSET, Clemson University, Clemson SC 29634, US
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    Lei Wang, Meiting Wang, Luwei Wang, Xiaomin Zheng, Jiajie Chen, Wenshuai Wu, Wei Yan, Bin Yu, Junle Qu, Bruce Zhi Gao, Yonghong Shao, "Stimulated emission–depletion-based point-scanning structured illumination microscopy," Chin. Opt. Lett. 22, 031701 (2024)

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    Paper Information

    Category: Biophotonics

    Received: Oct. 6, 2023

    Accepted: Oct. 26, 2023

    Published Online: Mar. 14, 2024

    The Author Email: Jiajie Chen (cjj@szu.edu.cn), Yonghong Shao (shaoyh@szu.edu.cn)

    DOI:10.3788/COL202422.031701

    CSTR:32184.14.COL202422.031701

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology