Chinese Optics Letters, Volume. 22, Issue 3, 031701(2024)
Stimulated emission–depletion-based point-scanning structured illumination microscopy
Lei Wang1,2, Meiting Wang1, Luwei Wang3, Xiaomin Zheng3, Jiajie Chen3、*, Wenshuai Wu3, Wei Yan3, Bin Yu3, Junle Qu3, Bruce Zhi Gao4, and Yonghong Shao3、**
Author Affiliations
1Guangdong Key Laboratory for Biomedical Measurements and Ultrasound Imaging, National-Regional Key Technology Engineering Laboratory for Medical Ultrasound, School of Biomedical Engineering, Shenzhen University Medical School, Shenzhen 518060, China2Key Laboratory of Opto-electronic Information Science and Technology of Jiangxi Province, Nanchang Hangkong University, Nanchang 330063, China3College of Physics and Optoelectronics Engineering, Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, Shenzhen University, Shenzhen 518060, China4Department of Bioengineering and COMSET, Clemson University, Clemson SC 29634, USshow less
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Lei Wang, Meiting Wang, Luwei Wang, Xiaomin Zheng, Jiajie Chen, Wenshuai Wu, Wei Yan, Bin Yu, Junle Qu, Bruce Zhi Gao, Yonghong Shao, "Stimulated emission–depletion-based point-scanning structured illumination microscopy," Chin. Opt. Lett. 22, 031701 (2024)
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