Laser & Optoelectronics Progress, Volume. 62, Issue 14, 1412003(2025)

High Precision 3D Measurement Method Based on Random Scanning Error Suppression

Lei Liu, Wei Liu, and Xusheng Zhu*
Author Affiliations
  • Avic Chengdu Aircraft Industrial (Group) Co., Ltd., Chengdu 610092, Sichuan , China
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    References(26)

    [17] Feng C, Luo M L, Deng G X et al. Multi-view structured light 3D measurement method based on reference standard parts[J]. Chinese Journal of Lasers, 51, 1704002(2024).

    [18] Dai Z Q, Bi X L, Fan J C. Reconstruction algorithm of structured light illumination microscopy based on similar block denoising and empirical mode decomposition[J]. Chinese Journal of Lasers, 49, 1507206(2022).

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    Lei Liu, Wei Liu, Xusheng Zhu. High Precision 3D Measurement Method Based on Random Scanning Error Suppression[J]. Laser & Optoelectronics Progress, 2025, 62(14): 1412003

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Dec. 12, 2024

    Accepted: Feb. 4, 2025

    Published Online: Jul. 2, 2025

    The Author Email: Xusheng Zhu (zhuxusheng@buaa.edu.cn)

    DOI:10.3788/LOP242416

    CSTR:32186.14.LOP242416

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