Laser & Optoelectronics Progress, Volume. 62, Issue 14, 1412003(2025)
High Precision 3D Measurement Method Based on Random Scanning Error Suppression
[17] Feng C, Luo M L, Deng G X et al. Multi-view structured light 3D measurement method based on reference standard parts[J]. Chinese Journal of Lasers, 51, 1704002(2024).
[18] Dai Z Q, Bi X L, Fan J C. Reconstruction algorithm of structured light illumination microscopy based on similar block denoising and empirical mode decomposition[J]. Chinese Journal of Lasers, 49, 1507206(2022).
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Lei Liu, Wei Liu, Xusheng Zhu. High Precision 3D Measurement Method Based on Random Scanning Error Suppression[J]. Laser & Optoelectronics Progress, 2025, 62(14): 1412003
Category: Instrumentation, Measurement and Metrology
Received: Dec. 12, 2024
Accepted: Feb. 4, 2025
Published Online: Jul. 2, 2025
The Author Email: Xusheng Zhu (zhuxusheng@buaa.edu.cn)
CSTR:32186.14.LOP242416