Laser & Optoelectronics Progress, Volume. 62, Issue 14, 1412003(2025)

High Precision 3D Measurement Method Based on Random Scanning Error Suppression

Lei Liu, Wei Liu, and Xusheng Zhu*
Author Affiliations
  • Avic Chengdu Aircraft Industrial (Group) Co., Ltd., Chengdu 610092, Sichuan , China
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    Figures & Tables(8)
    Schematic diagram of measurement system
    Diagrams of simulated sample. (a) 3D structure of the simulated sample; (b) cross section of 200th row
    Results of simulation. (a) The restored results; (b) the error distribution; (c) the 200th row cross section of each restored result
    Configuration of experimental system
    Standard step sample surface height measurement results
    Comparison between practical modulation curves and theoretical modulation curves. (a) Comparison of 20 nm step group; (b) comparison of 30 nm step group; (c) comparison of 40 nm step group; (d) comparison of 50 nm step group
    Experimental results. (a) 3D restoration result of 20 nm step group; (b) 3D restoration result of 30 nm step group; (c) 3D restoration result of 40 nm step group; (d) 3D restoration result of 50 nm step group
    • Table 1. Comparison of the calculated value by the proposed method and the true value of scanning steps

      View table

      Table 1. Comparison of the calculated value by the proposed method and the true value of scanning steps

      No.True value /nmCalculated value /nm
      12020.00
      23029.99
      34039.96
      45049.93
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    Lei Liu, Wei Liu, Xusheng Zhu. High Precision 3D Measurement Method Based on Random Scanning Error Suppression[J]. Laser & Optoelectronics Progress, 2025, 62(14): 1412003

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Dec. 12, 2024

    Accepted: Feb. 4, 2025

    Published Online: Jul. 2, 2025

    The Author Email: Xusheng Zhu (zhuxusheng@buaa.edu.cn)

    DOI:10.3788/LOP242416

    CSTR:32186.14.LOP242416

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