Laser & Optoelectronics Progress, Volume. 62, Issue 14, 1412003(2025)
High Precision 3D Measurement Method Based on Random Scanning Error Suppression
Fig. 2. Diagrams of simulated sample. (a) 3D structure of the simulated sample; (b) cross section of 200th row
Fig. 3. Results of simulation. (a) The restored results; (b) the error distribution; (c) the 200th row cross section of each restored result
Fig. 6. Comparison between practical modulation curves and theoretical modulation curves. (a) Comparison of 20 nm step group; (b) comparison of 30 nm step group; (c) comparison of 40 nm step group; (d) comparison of 50 nm step group
Fig. 7. Experimental results. (a) 3D restoration result of 20 nm step group; (b) 3D restoration result of 30 nm step group; (c) 3D restoration result of 40 nm step group; (d) 3D restoration result of 50 nm step group
|
Get Citation
Copy Citation Text
Lei Liu, Wei Liu, Xusheng Zhu. High Precision 3D Measurement Method Based on Random Scanning Error Suppression[J]. Laser & Optoelectronics Progress, 2025, 62(14): 1412003
Category: Instrumentation, Measurement and Metrology
Received: Dec. 12, 2024
Accepted: Feb. 4, 2025
Published Online: Jul. 2, 2025
The Author Email: Xusheng Zhu (zhuxusheng@buaa.edu.cn)
CSTR:32186.14.LOP242416