Optics and Precision Engineering, Volume. 33, Issue 3, 389(2025)
Adaptive focusing evaluation algorithm for optical imaging of wafer positioning marks
Jin YANG1, Hangying ZHANG1,2,3、*, Kai MENG1,2,3, and Peihuang LOU1
Author Affiliations
1College of Mechanical and Electrical Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing2006, China2National Key Laboratory of Microwave Photonics, Nanjing10016, China3Key Laboratory of Aerospace Integrated Circuits and Microsystem, Ministry of Industry and Information Technology, Nanjing210016, Chinashow less