Opto-Electronic Engineering, Volume. 46, Issue 4, 18022010(2019)
Characterictics of absorption edge of SiO2 films
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Kong Mingdong, Li Bincheng, Guo Chun, Liu Chunding, He Wenyan. Characterictics of absorption edge of SiO2 films[J]. Opto-Electronic Engineering, 2019, 46(4): 18022010
Category: Article
Received: Apr. 5, 2018
Accepted: --
Published Online: May. 4, 2019
The Author Email: Mingdong Kong (kongmd@ioe.ac.cn)