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Opto-Electronic Engineering, Volume. 46, Issue 4, 18022010(2019)

Characterictics of absorption edge of SiO2 films

Kong Mingdong1,2、*, Li Bincheng3, Guo Chun1, Liu Chunding1, and He Wenyan1
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    Kong Mingdong, Li Bincheng, Guo Chun, Liu Chunding, He Wenyan. Characterictics of absorption edge of SiO2 films[J]. Opto-Electronic Engineering, 2019, 46(4): 18022010

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    Paper Information

    Category: Article

    Received: Apr. 5, 2018

    Accepted: --

    Published Online: May. 4, 2019

    The Author Email: Kong Mingdong (kongmd@ioe.ac.cn)

    DOI:10.12086/oee.2019.18022010

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology