Laser & Optoelectronics Progress, Volume. 61, Issue 13, 1300005(2024)

Progress in the Detection of Trap Density of States in Organic Thin Film Transistors

Yao Li*, Fenqiang Wang, Ailing Wang, Jun Lan, Liangpeng Liu, Huizhou Wu, and Pengjie Zhang
Author Affiliations
  • School of Electronics and Information Engineering, Lanzhou Jiaotong University, Lanzhou 730070, Gansu , China
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    References(100)

    [18] Pal S, Kumar B, Mittal P. Impact of different gate dielectrics on OTFT-driven active matrix OLED[J]. Физика и техника полупроводников, 55, 474(2021).

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    Yao Li, Fenqiang Wang, Ailing Wang, Jun Lan, Liangpeng Liu, Huizhou Wu, Pengjie Zhang. Progress in the Detection of Trap Density of States in Organic Thin Film Transistors[J]. Laser & Optoelectronics Progress, 2024, 61(13): 1300005

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    Paper Information

    Category: Reviews

    Received: Sep. 11, 2023

    Accepted: Nov. 7, 2023

    Published Online: Jul. 17, 2024

    The Author Email: Yao Li (liyao@mail.lzjtu.cn)

    DOI:10.3788/LOP232085

    CSTR:32186.14.LOP232085

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