Experiment and Analysis of Damage Effect of Proton Irradiation on Transmission Transistor of CMOS Image Sensor

Ning Tang; Zujun Wang; Shixing Yan; Chuanzhou Li; Rongyu Jiang

doi:10.3788/AOS240439

Acta Optica Sinica, Volume. 44, Issue 9, 0928003(2024)

Experiment and Analysis of Damage Effect of Proton Irradiation on Transmission Transistor of CMOS Image Sensor

Ning Tang¹, Zujun Wang^1,2、*, Shixing Yan¹, Chuanzhou Li¹, and Rongyu Jiang¹

Author Affiliations

¹School of Materials Science and Engineering, Xiangtan University, Xiangtan 411105, Hunan , China

²National Key Laboratory of Intense Pulsed Irradiation Simulation and Effect, Northwest Institute of Nuclear Technology, Xi an 710024, Shaanxi , China

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Ning Tang, Zujun Wang, Shixing Yan, Chuanzhou Li, Rongyu Jiang. Experiment and Analysis of Damage Effect of Proton Irradiation on Transmission Transistor of CMOS Image Sensor[J]. Acta Optica Sinica, 2024, 44(9): 0928003

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Paper Information

Category: Remote Sensing and Sensors

Received: Jan. 2, 2024

Accepted: Feb. 26, 2024

Published Online: May. 10, 2024

The Author Email: Zujun Wang (wzj029@qq.com)

DOI:10.3788/AOS240439

CSTR:32393.14.AOS240439

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