Journal of Infrared and Millimeter Waves, Volume. 40, Issue 5, 576(2021)

Numerical simulation of high-operating-temperature MWIR HgCdTe APD detectors

Chuan SHEN1, Liao YANG1, Hui-Jun GUO1, Dan YANG1, Lu CHEN1,2、*, and Li HE1
Author Affiliations
  • 1Key Laboratory of Infrared Imaging Materials and Detectors,Shanghai Institute of Technical Physics,Chinese Academy of Sciences,Shanghai 200083,China
  • 2Hangzhou Insitute for Advanced Study,University of Chinese Academy of Sciences,Hangzhou 310024,China
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    Figures & Tables(8)
    2-D structural model of HgCdTe APD
    Comparison of dark current curves between experiment and numerical simulation of avalanche devices
    Changes of the dark current density of APD devices at different temperatures
    Different dark current mechanisms affecting devices at different operating temperatures (a)80K (b)100K,(c)150K,(d)200K
    The dark current density and gain of HgCdTe APD change with different Ni layer thickness(a)Dark current density(b)Gain
    The dark current density and gain of HgCdTe APD change with different doping of Ni layer(a)Dark current density(b)Gain
    • Table 1. Device structure parameters involved in numerical simulation

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      Table 1. Device structure parameters involved in numerical simulation

      参数N+层Ni层P层
      厚度(μm)22.9810
      掺杂浓度(cm-35×10171×10148×1015
      组分0.30.30.3
    • Table 2. Optimized Structural parameters of HOT HgCdTe APD

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      Table 2. Optimized Structural parameters of HOT HgCdTe APD

      参数N+层Ni层P层
      厚度(μm)1~22~39~10
      掺杂浓度(cm-3≥5×1016≤1×1015≥3×1016
      组分0.30.30.3
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    Chuan SHEN, Liao YANG, Hui-Jun GUO, Dan YANG, Lu CHEN, Li HE. Numerical simulation of high-operating-temperature MWIR HgCdTe APD detectors[J]. Journal of Infrared and Millimeter Waves, 2021, 40(5): 576

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    Paper Information

    Category: Research Articles

    Received: Nov. 4, 2020

    Accepted: --

    Published Online: Sep. 29, 2021

    The Author Email: Lu CHEN (chenlu@mail.sitp.ac.cn)

    DOI:10.11972/j.issn.1001-9014.2021.05.002

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