Acta Optica Sinica, Volume. 45, Issue 5, 0512003(2025)
X‑Ray Mirror Surface Profile Measurement with Nanometer Accuracy Based on Three‑Displacement Sensors
Fig. 2. Schematic diagram for measurement of mirror surface profile with three interferometric displacement sensors
Fig. 5. Schematic diagram of temperature measurement experiments. (a) The first temperature measurement experiment; (b) the second temperature measurement experiment
Fig. 6. PV and STD of displacements per hour. (a) PV of displacements per hour; (b) STD of displacements per hour
Fig. 7. Results of the first temperature measurement experiment. (a) Temperature variation curves; (b) displacement variation curves
Fig. 8. Results of the second temperature measurement experiment. (a) Temperature variation curves; (b) displacement variation curves
Fig. 9. Surface profiles of five measurements and difference between each profile and average profile. (a) Surface profile; (b) difference between each profile and average profile
|
Get Citation
Copy Citation Text
Jiezhuo Wang, Guang Zhou, Weizheng Lei, Xiaohao Dong, Jie Wang. X‑Ray Mirror Surface Profile Measurement with Nanometer Accuracy Based on Three‑Displacement Sensors[J]. Acta Optica Sinica, 2025, 45(5): 0512003
Category: Instrumentation, Measurement and Metrology
Received: Nov. 21, 2024
Accepted: Jan. 16, 2025
Published Online: Mar. 26, 2025
The Author Email: Xiaohao Dong (dongxh@sari.ac.cn), Jie Wang (wangjie@sari.ac.cn)
CSTR:32393.14.AOS241783