Acta Optica Sinica, Volume. 45, Issue 5, 0512003(2025)

X‑Ray Mirror Surface Profile Measurement with Nanometer Accuracy Based on Three‑Displacement Sensors

Jiezhuo Wang1,2, Guang Zhou1,2, Weizheng Lei3, Xiaohao Dong4、*, and Jie Wang4、**
Author Affiliations
  • 1Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China
  • 2University of Chinese Academy of Sciences, Beijing 100049, China
  • 3ShanghaiTech University, Shanghai 201210, China
  • 4Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201210, China
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    Figures & Tables(11)
    Measurement of surface profile with interferometric displacement sensor
    Schematic diagram for measurement of mirror surface profile with three interferometric displacement sensors
    Motion error of guideway
    Experimental setup
    Schematic diagram of temperature measurement experiments. (a) The first temperature measurement experiment; (b) the second temperature measurement experiment
    PV and STD of displacements per hour. (a) PV of displacements per hour; (b) STD of displacements per hour
    Results of the first temperature measurement experiment. (a) Temperature variation curves; (b) displacement variation curves
    Results of the second temperature measurement experiment. (a) Temperature variation curves; (b) displacement variation curves
    Surface profiles of five measurements and difference between each profile and average profile. (a) Surface profile; (b) difference between each profile and average profile
    Experimental results of sensors and Fizeau interferometer
    • Table 1. Experimental conditions

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      Table 1. Experimental conditions

      ParameterValue
      Scanning speed /(mm/s)0.53
      Scanning range /mm25
      Sample rate /Hz10
      Pause time /s30
      Distance between sensor and sample /mm~50
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    Jiezhuo Wang, Guang Zhou, Weizheng Lei, Xiaohao Dong, Jie Wang. X‑Ray Mirror Surface Profile Measurement with Nanometer Accuracy Based on Three‑Displacement Sensors[J]. Acta Optica Sinica, 2025, 45(5): 0512003

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Nov. 21, 2024

    Accepted: Jan. 16, 2025

    Published Online: Mar. 26, 2025

    The Author Email: Xiaohao Dong (dongxh@sari.ac.cn), Jie Wang (wangjie@sari.ac.cn)

    DOI:10.3788/AOS241783

    CSTR:32393.14.AOS241783

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