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Chinese Optics Letters, Volume. 13, Issue 12, 123101(2015)

Using lead germanium telluride as a high-index coating material in the mid-wavelength infrared narrow bandpass filters

Ping Xie1, Bin Li1、*, Suying Zhang1, and Dingquan Liu1,2
Author Affiliations
  • 1Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China
  • 2School of Physical Science and Technology, Shanghai Tech University, Shanghai 200031, China
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    [1] M. A. Macleod. Thin-Film Optical Filters(2010).

    [2] J. S. Seeley, R. Hunneman, A. Whatley. Appl. Opt., 20, 31(1981).

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    [4] Y. Yen, L. Zhu, W. Zhang, F. Zhang, S. Wang. Appl. Opt., 23, 3597(1984).

    [5] B. Li, S. Zhang, F. Zhang, L. Zeng. Appl. Phys. A, 76, 965(2003).

    [6] D. K. Hohnke, H. Holloway, S. Kaiser. J. Phys. Chem. Solids, 33, 2053(1972).

    [7] B. Li, J. Jiang, S. Zhang, F. Zhang. J. Appl. Phys., 91, 3556(2002).

    [8] B. Li, S. Zhang, J. Jiang, B. Fan, F. Zhang. Opt. Express, 12, 401(2004).

    [9] B. Li, S. Zhang, J. Jiang, D. Liu, F. Zhang. Opt. Express, 13, 6376(2005).

    [10] B. Li, P. Xie, S. Zhang, D. Liu. J. Mater. Sci., 46, 4000(2011).

    [11] B. Li, P. Xie, S. Zhang, D. Liu. J. Alloys Compd., 589, 109(2014).

    [12] W. Su, B. Li, D. Liu, F. Zhang. J. Phys. D Appl. Phys., 40, 3343(2007).

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    [1] Lingmao Xu, Hui Zhou, Yanchun He, Kaifeng Zhang, Shenghu Wu, Yuqing Xiong, "Temperature coefficient of the refractive index for PbTe film," Chin. Opt. Lett. 15, 043101 (2017)

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    Ping Xie, Bin Li, Suying Zhang, Dingquan Liu, "Using lead germanium telluride as a high-index coating material in the mid-wavelength infrared narrow bandpass filters," Chin. Opt. Lett. 13, 123101 (2015)

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    Paper Information

    Category: Thin films

    Received: Jul. 20, 2015

    Accepted: Oct. 27, 2015

    Published Online: Sep. 12, 2018

    The Author Email: Bin Li (binli@mail.sitp.ac.cn)

    DOI:10.3788/COL201513.123101

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology