Opto-Electronic Engineering, Volume. 52, Issue 1, 240250(2025)

PIC2f-YOLO: a lightweight method for the detection of metal surface defects

Yilun Hu1,2, Jun Yang2, Congyuan Xu2, Yajin Xia3, and Wenbin Deng2、*
Author Affiliations
  • 1College of Computer Science and Technology, Zhejiang Sci-Tech University, Hangzhou, Zhejiang 310018, China
  • 2College of Information Science and Engineering, Jiaxing University, Jiaxing, Zhejiang 314001, China
  • 3Haiyan ZhongDA METAL Electronic Material Co., LTD, Jiaxing, Zhejiang 314300, China
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    Yilun Hu, Jun Yang, Congyuan Xu, Yajin Xia, Wenbin Deng. PIC2f-YOLO: a lightweight method for the detection of metal surface defects[J]. Opto-Electronic Engineering, 2025, 52(1): 240250

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    Paper Information

    Category: Article

    Received: Oct. 23, 2024

    Accepted: Dec. 16, 2024

    Published Online: Feb. 21, 2025

    The Author Email: Wenbin Deng (邓文斌)

    DOI:10.12086/oee.2025.240250

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