Opto-Electronic Engineering, Volume. 52, Issue 1, 240250(2025)
PIC2f-YOLO: a lightweight method for the detection of metal surface defects
Yilun Hu1,2, Jun Yang2, Congyuan Xu2, Yajin Xia3, and Wenbin Deng2、*
Author Affiliations
1College of Computer Science and Technology, Zhejiang Sci-Tech University, Hangzhou, Zhejiang 310018, China2College of Information Science and Engineering, Jiaxing University, Jiaxing, Zhejiang 314001, China3Haiyan ZhongDA METAL Electronic Material Co., LTD, Jiaxing, Zhejiang 314300, Chinashow less