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Acta Optica Sinica, Volume. 25, Issue 2, 203(2005)

Calibration of the Measurement System Based on Modulation Measurement Profilometry

[in Chinese]1,2、*, [in Chinese]1, [in Chinese]2, and [in Chinese]3
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  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    [2] [2] Su L. K., Su X. Y., Li W. S. et al.. Application of modulation measurement profilometry to objects with surface holes[J]. Appl. Opt., 1999, 38(7): 1153～1158

    [3] [3] Su Xian-Yu, Su Li-Kun, Li Wan-Song. New Fourier transform profilometry based on modulation measurement[C]. Proc. SPIE, 1999, 3749: 438～439

    [6] [6] Takeda Mitsuo, Mutoh Kazuhiro. Fourier transform profilometry for the automatic measurement of 3-D object shapes[J]. Appl. Opt., 1983, 22(24): 3977～3982

    [7] [7] Srinivasan V., Liu H. C., Halioua Maurice. Automated phase-measuring profilometry: a phase mapping approach[J]. Appl. Opt., 1985, 24(2): 185～188

    CLP Journals

    [1] Wang Ying, Su Xianyu. A Fast Three-Dimensional Object Recognition Based on Modulation Analysis[J]. Acta Optica Sinica, 2010, 30(3): 720

    [2] Dou Yunfu, Su Xianyu, Chen Yanfei. A Fast Modulation Measurement Profilometry[J]. Acta Optica Sinica, 2009, 29(7): 1858

    [3] Zheng Xu, Cao Yiping, Li Kun. An OnLine 3D Measurement Method Based on Modulation Delamination[J]. Acta Optica Sinica, 2010, 30(9): 2573

    [4] Wu Xiaoping, Yu Yanmei, Wu Xiaohong, Luo Daisheng. Object Cut Length Measurement Using Light-Knife Based on New Linear Calibration[J]. Laser & Optoelectronics Progress, 2010, 47(3): 31202

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Calibration of the Measurement System Based on Modulation Measurement Profilometry[J]. Acta Optica Sinica, 2005, 25(2): 203

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Jun. 4, 2004

    Accepted: --

    Published Online: May. 22, 2006

    The Author Email: (shao_sy@tom.com)

    DOI:

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology