Study on eight-pass dual-frequency laser interferometer with nanometer precision

Haijun Gao; Zhaogu Cheng; Zhigao Ning; Pinjing Cui; Huijie Huang

Chinese Optics Letters, Volume. 3, Issue 9, 09513(2005)

Haijun Gao^1,2、*, Zhaogu Cheng^1,2, Zhigao Ning^1,2, Pinjing Cui^1,2, and Huijie Huang^1,2

Author Affiliations

¹Precise Optoelectronic Measure and Control R&

²D Center, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800

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References(9)

[1] [1] B. Y. Chen, X. H. Cheng, and D. C. Li, Appl. Opt. 41, 5933 (2002).

[2] [2] J. Lawall, Opt. Photon. News 15, 40 (2004).

[3] [3] D.-I. Lee and C. Roychoudhuri, Opt. Express 11, 944 (2003).

[4] [4] Y. Zhao, T. Zhou, and D. Li, Opt. Eng. 38, 246 (1999).

[5] [5] Z.-F. Zhou, T. Zhang, W. Huang, L.-D. Guo, and J. Huang, Appl. Opt. 43, 4816 (2004).

[6] [6] Z. Cheng, H. Gao, X. Chai, Z. Ning, and H. Huang, Proc. SPIE 5662, 395 (2004).

[7] [7] X. Guan, S. Yuan, and Y. Liu, Dual-Frequency Laser Interferometer (in Chinese) (China Metrology Press, Beijing, 1987) p.27.

[8] [8] W. T. Estler, Appl. Opt. 24, 808 (1985).

[9] [9] Agilent 5529A Dynamic Calibrator Data Sheet.

CLP Journals

[1] Zhiping Zhang, Zhaogu Cheng, Zhaoyu Qin, Jianqiang Zhu, "Measuring of the maximum measurable velocity for dual-frequency laser interferometer," Chin. Opt. Lett. 5, 208 (2007)

[2] Zhiping Zhang, Zhaogu Cheng, Zhaoyu Qin, Jianqiang Zhu, "Micro-Gal laser absolute gravimeter based on high precision heterodyne interferometer," Chin. Opt. Lett. 5, 344 (2007)

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Haijun Gao, Zhaogu Cheng, Zhigao Ning, Pinjing Cui, Huijie Huang, "Study on eight-pass dual-frequency laser interferometer with nanometer precision," Chin. Opt. Lett. 3, 09513 (2005)

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Paper Information

Category: Instrumentation, measurement, and metrology

Received: Jan. 25, 2005

Accepted: --

Published Online: Jun. 6, 2006

The Author Email: Haijun Gao (gaohj@siom.ac.cn)

DOI:

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology