Design and Test of High-Resolution Imaging System for Ultracold Atoms

Fig. 2. Results of image quality evaluation of microscopic objective system. (a) Spot diagram; (b) ray aberration; (c) MTF curves; (d) wave aberration

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Fig. 3. MTF curves of optical system under different thickness of vacuum window

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Fig. 4. Photomechanical structure of microscopic objective lens. (a) Design results; (b) physical drawing

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Fig. 5. Preliminary test lightpath of resolution board

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Fig. 6. High resolution imaging system. (a) Lightpath; (b) ray aberration; (c) spot diagram

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$Point spread function test. (a) Pinhole image under electron microscope; (b) pinhole diffraction image on CCD; (c) diffraction pattern of pinhole; (d) Gaussian fitting PSF$

Fig. 7. Point spread function test. (a) Pinhole image under electron microscope; (b) pinhole diffraction image on CCD; (c) diffraction pattern of pinhole; (d) Gaussian fitting PSF

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Table 1. Specific parameters of microscopic objective system

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Table 1. Specific parameters of microscopic objective system

Lens	Surface No.	Radius /mm	Thickness /mm	Material	Semi-diameter /mm
LC1315-B	1	Infinity	3.500	N-BK7	25.4
LC1315-B	2	38.590	22.170	Air	25.4
KBX151AR	3	89.470	10.362	N-BK7	25.4
KBX151AR	4	-89.470	6.890	Air	25.4
LE1418-B	5	47.870	7.290	N-BK7	25.4
LE1418-B	6	119.320	5.790	Air	25.4
Custom lens 1	7	32.732	12.635	N-BK7	25.4
Custom lens 1	8	157.837	4.910	Air	25.4
Custom lens 2	9	12.711	4.003	N-BK7	9.6
Custom lens 2	10	21.230	2.908	Air	9.6
Vacuum window	11	Infinity	3.350	Silica	25.0
Vacuum chamber	12	Infinity	10.000	Vacuum	25.0

Table 2. Parameters of common elements in ultracold atoms
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Table 2. Parameters of common elements in ultracold atoms
Material λ /nm Resolution /μm NA FOV /μm
Li 671 0.74 0.55 280
Na 589 0.64 0.56 280
K 767 0.85 0.55 280
Rb 780 0.87 0.55 280
Cs 852 0.95 0.55 280

Table 3. Tolerance setting of microscopic objective lens
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Table 3. Tolerance setting of microscopic objective lens
Parameter Value
Radius /λ 3/2
Surface irregularity /λ 1/4
Thickness /mm ±0.1
Air space /mm ±0.05
Tilt /（＇） 1
Decentration /mm ±0.02
Refractive index 0.0005

Table 4. Analysis results of Monte Carlo
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Table 4. Analysis results of Monte Carlo
Probability /% MTF threshold
90 >0.30697373
80 >0.33699300
50 >0.41048692
20 >0.46395389
10 >0.48135166

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Jiahui Xia, Fang Li, ShuJin Deng, Haibin Wu. Design and Test of High-Resolution Imaging System for Ultracold Atoms[J]. Laser & Optoelectronics Progress, 2022, 59(2): 0222001

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