Semiconductor Optoelectronics, Volume. 45, Issue 1, 117(2024)
High-reliability Bonding Process of Infrared Detector Chip
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LI Junguang, WANG Xiao, QIAO Jun, LI Peng. High-reliability Bonding Process of Infrared Detector Chip[J]. Semiconductor Optoelectronics, 2024, 45(1): 117
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Received: Sep. 22, 2023
Accepted: --
Published Online: Jun. 25, 2024
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