Chinese Optics Letters, Volume. 23, Issue 7, 071203(2025)

Accuracy improvement of AC Stark shift microwave detection based on a “frequency ruler”

Shuai Liu1... Zhonghao Li2,*, Bin Li2, Liting Zhang2, Shihong Xu2, Jingxia Kong2, Hao Guo2, Huanfei Wen2, Zongmin Ma1, Xin Li2, Jun Tang1,** and Jun Liu2,*** |Show fewer author(s)
Author Affiliations
  • 1State Key Laboratory of Widegap Semiconductor Optoelectronic Materials and Technologies, North University of China, Taiyuan 030051, China
  • 2State Key Laboratory of Extreme Environment Optoelectronic Dynamic Testing Technology and Instruments, Shanxi Province Key Laboratory of Quantum Sensing and Precision Measurement, North University of China, Taiyuan 030051, China
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    References(32)

    [19] N. Schlossberger, T. McDonald, K. Su et al. Two-dimensional imaging of electromagnetic fields via light sheet fluorescence imaging with Rydberg atomsar(2024).

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    Shuai Liu, Zhonghao Li, Bin Li, Liting Zhang, Shihong Xu, Jingxia Kong, Hao Guo, Huanfei Wen, Zongmin Ma, Xin Li, Jun Tang, Jun Liu, "Accuracy improvement of AC Stark shift microwave detection based on a “frequency ruler”," Chin. Opt. Lett. 23, 071203 (2025)

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    Paper Information

    Category: Instrumentation, Measurement, and Optical Sensing

    Received: Jan. 18, 2025

    Accepted: Mar. 17, 2025

    Published Online: Jun. 18, 2025

    The Author Email: Zhonghao Li (lizh@nuc.edu.cn), Jun Tang (tangjun@nuc.edu.cn), Jun Liu (liuj@nuc.edu.cn)

    DOI:10.3788/COL202523.071203

    CSTR:32184.14.COL202523.071203

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