Chinese Optics Letters, Volume. 23, Issue 7, 071203(2025)

Accuracy improvement of AC Stark shift microwave detection based on a “frequency ruler”

Shuai Liu1, Zhonghao Li2、*, Bin Li2, Liting Zhang2, Shihong Xu2, Jingxia Kong2, Hao Guo2, Huanfei Wen2, Zongmin Ma1, Xin Li2, Jun Tang1、**, and Jun Liu2、***
Author Affiliations
  • 1State Key Laboratory of Widegap Semiconductor Optoelectronic Materials and Technologies, North University of China, Taiyuan 030051, China
  • 2State Key Laboratory of Extreme Environment Optoelectronic Dynamic Testing Technology and Instruments, Shanxi Province Key Laboratory of Quantum Sensing and Precision Measurement, North University of China, Taiyuan 030051, China
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    Figures & Tables(5)
    (a) Wavelength meter-reading scheme. (b) Double Rydberg atomic excitation—the “frequency ruler” scheme.
    (a) Sketch of the experimental setup. PBS, polarizing beam splitter; RM, reflective mirror; DM, dichroic mirror; DPD, differential detector; λ/2: half-wave plate. (b) Atomic energy level systems.
    (a) EIT transmission peak. (b) AC Stark shifts of the 45D5/2 state.
    (a) Double EIT transmission peaks. (b) AC Stark shifts of the 45D5/2 state with “FR.”
    (a) Relationship between the AC Stark frequency shift and the square root of microwave power. (b) Differences between the experimental values and the fitted values.
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    Shuai Liu, Zhonghao Li, Bin Li, Liting Zhang, Shihong Xu, Jingxia Kong, Hao Guo, Huanfei Wen, Zongmin Ma, Xin Li, Jun Tang, Jun Liu, "Accuracy improvement of AC Stark shift microwave detection based on a “frequency ruler”," Chin. Opt. Lett. 23, 071203 (2025)

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    Paper Information

    Category: Instrumentation, Measurement, and Optical Sensing

    Received: Jan. 18, 2025

    Accepted: Mar. 17, 2025

    Published Online: Jun. 18, 2025

    The Author Email: Zhonghao Li (lizh@nuc.edu.cn), Jun Tang (tangjun@nuc.edu.cn), Jun Liu (liuj@nuc.edu.cn)

    DOI:10.3788/COL202523.071203

    CSTR:32184.14.COL202523.071203

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