Chinese Optics Letters, Volume. 23, Issue 7, 071203(2025)
Accuracy improvement of AC Stark shift microwave detection based on a “frequency ruler”
Fig. 1. (a) Wavelength meter-reading scheme. (b) Double Rydberg atomic excitation—the “frequency ruler” scheme.
Fig. 2. (a) Sketch of the experimental setup. PBS, polarizing beam splitter; RM, reflective mirror; DM, dichroic mirror; DPD, differential detector; λ/2: half-wave plate. (b) Atomic energy level systems.
Fig. 3. (a) EIT transmission peak. (b) AC Stark shifts of the 45D5/2 state.
Fig. 4. (a) Double EIT transmission peaks. (b) AC Stark shifts of the 45D5/2 state with “FR.”
Fig. 5. (a) Relationship between the AC Stark frequency shift and the square root of microwave power. (b) Differences between the experimental values and the fitted values.
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Shuai Liu, Zhonghao Li, Bin Li, Liting Zhang, Shihong Xu, Jingxia Kong, Hao Guo, Huanfei Wen, Zongmin Ma, Xin Li, Jun Tang, Jun Liu, "Accuracy improvement of AC Stark shift microwave detection based on a “frequency ruler”," Chin. Opt. Lett. 23, 071203 (2025)
Category: Instrumentation, Measurement, and Optical Sensing
Received: Jan. 18, 2025
Accepted: Mar. 17, 2025
Published Online: Jun. 18, 2025
The Author Email: Zhonghao Li (lizh@nuc.edu.cn), Jun Tang (tangjun@nuc.edu.cn), Jun Liu (liuj@nuc.edu.cn)