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Microelectronics, Volume. 52, Issue 3, 498(2022)

Study on CTE Mismatch Failure Analysis and Optimization of a Large Size CLCC Device

WANG Yuan, YI Wenshuang, and MA Minshu
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    [1] [1] STEINBERG D S. Cooling techniques for electronic equipment ［M］. New York: John Wiley & Sons, 1991： 45-66.

    [10] [10] PAO Y H. A fracture mechanism approach to thermal fatigue life prediction of solder joints ［J］. IEEE Trans Compon Hybrids Manuf Technol, 1992, 15(4): 559-570.

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    WANG Yuan, YI Wenshuang, MA Minshu. Study on CTE Mismatch Failure Analysis and Optimization of a Large Size CLCC Device[J]. Microelectronics, 2022, 52(3): 498

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    Paper Information

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    Received: Mar. 1, 2022

    Accepted: --

    Published Online: Jan. 18, 2023

    The Author Email:

    DOI:10.13911/j.cnki.1004-3365.220074

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology