Microelectronics, Volume. 52, Issue 3, 498(2022)
Study on CTE Mismatch Failure Analysis and Optimization of a Large Size CLCC Device
Figures & Tables(0)
Tools
Get Citation
Copy Citation Text
WANG Yuan, YI Wenshuang, MA Minshu. Study on CTE Mismatch Failure Analysis and Optimization of a Large Size CLCC Device[J]. Microelectronics, 2022, 52(3): 498
Paper Information
Category:
Received: Mar. 1, 2022
Accepted: --
Published Online: Jan. 18, 2023
The Author Email:
© Copyright 2018-2021 | Chinese Laser Press.
All Rights Reserved 沪ICP备15018463号-20