Journal of Infrared and Millimeter Waves, Volume. 43, Issue 4, 526(2024)
The physical model,structural fabrication,and DC testing of lateral gate transistor terahertz detectors
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Ya-Ru KANG, Hui DONG, Jing LIU, Zhen HUANG, Zhao-Feng LI, Wei YAN, Xiao-Dong WANG. The physical model,structural fabrication,and DC testing of lateral gate transistor terahertz detectors[J]. Journal of Infrared and Millimeter Waves, 2024, 43(4): 526
Category: Research Articles
Received: Sep. 23, 2023
Accepted: --
Published Online: Aug. 27, 2024
The Author Email: Zhao-Feng LI (lizhaofeng@semi.ac.cn), Wei YAN (yanwei@semi.ac.cn)