Chinese Journal of Lasers, Volume. 44, Issue 11, 1104003(2017)

Method of Large-Scale Measurement Based on Multi-Vision Line Structured Light Sensor

Li Taotao1,2、*, Yang Feng1, and Xu Xianlei1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • show less
    References(24)

    [9] Garrido-Jurado S, Munoz-Salinas R. Madrid-Cuevas F J, et al. Simultaneous reconstruction and calibration for multi-view structured light scanning[J]. Journal of Visual Communication and Image Representation, 39, 120-131(2016).

    [17] Masuda T, Sakaue K, Yokoya N. Registration and integration of multiple range images for 3-D model construction[C]. Proceedings of 13th International Conference on Pattern Recognition, 1, 879-883(1996).

    CLP Journals

    [1] Tingting Liu, Peiguang Wang, Na Zhang. Subpixel Defect Detection in Highly Reflective Workpieces Based on Zernike Moments[J]. Laser & Optoelectronics Progress, 2019, 56(12): 121203

    [2] Yanyu Zhu. Edge Detection of Pantographic Slide Under Complex Circumstance[J]. Laser & Optoelectronics Progress, 2018, 55(6): 061501

    [3] He Zhichao, Zhao Longzhang, Chen Chuang. Convolution Neural Network with Multi-Resolution Feature Fusion for Facial Expression Recognition[J]. Laser & Optoelectronics Progress, 2018, 55(7): 71503

    [4] Dan Liu, Bin Zhang, Huixian Li, Wenhao Song, Fengyu Li, Tengda Yang. Detection of Micro-Cylinder End Face Defect in Complex Background[J]. Laser & Optoelectronics Progress, 2018, 55(6): 061006

    [5] Wang Jiwu, Yu Pengfei, Luo Haibao, Li Chenyang. Smoothing Processing Method of Laser Line Segmental Light Based on Polynomial Fitting[J]. Laser & Optoelectronics Progress, 2018, 55(9): 91204

    Tools

    Get Citation

    Copy Citation Text

    Li Taotao, Yang Feng, Xu Xianlei. Method of Large-Scale Measurement Based on Multi-Vision Line Structured Light Sensor[J]. Chinese Journal of Lasers, 2017, 44(11): 1104003

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: measurement and metrology

    Received: Apr. 9, 2017

    Accepted: --

    Published Online: Nov. 17, 2017

    The Author Email: Taotao Li (ltaotao1988@126.com)

    DOI:10.3788/CJL201744.1104003

    Topics