Chinese Journal of Lasers, Volume. 44, Issue 11, 1104003(2017)

Method of Large-Scale Measurement Based on Multi-Vision Line Structured Light Sensor

Li Taotao1,2、*, Yang Feng1, and Xu Xianlei1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • show less
    Figures & Tables(10)
    Schematic diagram of line structured light sensor
    Model of multi-vision line structured light sensor system
    Process of sensor calibration
    Setup diagram of large-scale measurement system
    PTM calibration source images matching. (a)Images matching of slave camera 1 and master camera; (b) images matching of slave camera 2 and slave camera 1
    High-precision rack
    Comparison of the measurement results. (a) Measured profiles of the 9th tooth with the proposed method; (b) RSS of rack
    (a) Local light stripe image of master camera; (b) local light stripe image of slave camera 1; (c) local light stripe image of slave camera 2; (d) result of light stripe images stitching
    Comparison of the measurement results and local typical damages. (a),(b),(c),(d) Severely damaged area S; (e) pothole; (f) crack area 1; (g) crack area 2; (h) profile of crack
    • Table 1. Comparison on evaluation parameters of actual model and reconstructed models

      View table

      Table 1. Comparison on evaluation parameters of actual model and reconstructed models

      ModelTD /mmTD error (δ)Crack parameter
      BranchcountLength /mmWidth /mm
      L1=525 mmL2=493 mmL3=418 mmL4=373 mm
      Actual2.102054982.282.405.132.89
      Method 11.58324.7%43903.062.816.323.53
      Method 22.41214.7%64612.512.565.543.26
      Method 32.34911.8%64562.452.575.463.10
      Proposedmethod2.2738.3%54772.462.505.313.02
    Tools

    Get Citation

    Copy Citation Text

    Li Taotao, Yang Feng, Xu Xianlei. Method of Large-Scale Measurement Based on Multi-Vision Line Structured Light Sensor[J]. Chinese Journal of Lasers, 2017, 44(11): 1104003

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: measurement and metrology

    Received: Apr. 9, 2017

    Accepted: --

    Published Online: Nov. 17, 2017

    The Author Email: Taotao Li (ltaotao1988@126.com)

    DOI:10.3788/CJL201744.1104003

    Topics